Measurement of the diameter of profiles

Optical micrometers from Micro-Epsilon are used to monitor the thickness of metal bars. With the X-Frame measuring system the diameter is measured continuously. Two laser micrometers measure the diameter with high resolution and measuring rate. The X-Frame enables the measurement of different thicknesses, and digital interfaces transmit the data to the higher-level control system.

Doporučená technologie senzorů

optoCONTROL 2520

MICRO-EPSILON Czech Republic
Na Libuši 891
39165 Bechyně, Czech Republic
info@micro-epsilon.cz
+420 381 213 011
+420 381 211 060