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Planarity testing in hybrid bonding

In hybrid bonding in semiconductor production, exact planarity of the wafers is crucial for stable bonding processes. Capacitive distance sensors enable high-resolution measurement of shape deviations on wafers and provide the measurement data for…

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Large distances precisely in view

The new optoNCDT ILR1041-150 laser distance sensor enables reliable distance measurements of up to 150 m. Thanks to the time-of-flight measuring principle, integrated IO-Link communication, and robust design, the sensor is ideal for demanding…

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Multi-segment measurement on superconducting strips

During production of superconducting strips, 12 mm wide stainless steel strips are cut into narrow sections – separated by 0.5 mm gaps. The optoCONTROL 2700 LED micrometer measures the width of the sections and the gap position immediately after the…

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Mastering measurement tasks in a vacuum

Measurement tasks in a vacuum place the highest demands on the sensor technology used. This is exactly where precise measurement technology from Micro-Epsilon comes into its own: reliable, non-contact and stable, the sensors deliver exact data in…

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