In hybrid bonding in semiconductor production, exact planarity of the wafers is crucial for stable bonding processes. Capacitive distance sensors enable high-resolution measurement of shape deviations on wafers and provide the measurement data for…
The new optoNCDT ILR1041-150 laser distance sensor enables reliable distance measurements of up to 150 m. Thanks to the time-of-flight measuring principle, integrated IO-Link communication, and robust design, the sensor is ideal for demanding…
During production of superconducting strips, 12 mm wide stainless steel strips are cut into narrow sections – separated by 0.5 mm gaps. The optoCONTROL 2700 LED micrometer measures the width of the sections and the gap position immediately after the…